This white paper will explore NAND flash technology and its inherent problems, and explain how proper flash management algorithms can address these issues and transform NAND flash into a reliable media with a long lifespan.
The discussion will focus on single-level Cell (SLC) flash technology, due to its added reliability over multi-level cell (MLC) NAND flash. The flash management algorithms addressed in this document are implemented in the proprietary flash controllers HGST uses in its small-format embedded products: e.g., CompactFlash, embedded SATA, etc.
By utilizing a combination of strong wear leveling techniques, an effective ECC engine and a diligent bad block management system, the life expectancy of embedded flash products can be greatly maximized.
